Progres in ion beam analysis at Fudan University in the recent years is briefly reviewed. Presented as examples of the r......

Observation of epitaxial overlayer of metals at atomic level has been successfully observed infield ion microscope with ......

本文介绍了Ｘ射线双晶衍射仪的特点及其原理，以及利用Ｘ射线摇摆曲线技术在半导体材料研究方面的应用。......

利用透射电子显微镜和计算机图像模拟技术研究了ＬＩ２型Ａｌ３Ｔｉ合金室温变形的位错核心结构，结果表明：α（１１０）超位错在｛１１１｝面上分解成两个α／３｛１１２｝型超偏位错，其间......